Dedicated Analytical Solutions

 

NEW INFRATEC™ NOVA

White Paper: Grain testing made 20% faster
with Dynamic Sub-sampling™

New technology from FOSS makes testing even faster without affecting accuracy

 

Most have discovered the power of rapid NIR analysis. In this whitepaper by FOSS, you can learn how limiting the number of sub-scans for homogeneous samples can improve speed of NIR analysis without compromising accuracy.


Two minute operator time

 

 

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