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Grain analysis system gives the perfect blend of high and low protein wheat

Meet FOSS at GEAPS Stand no. 718

FOSS will be featuring the ProFoss™ for whole grain in-line solution at GEAPS, The Grain Elevator and Processing Society ‘Expo 13’ to be held February 23-26, in Louisville, Kentucky, USA.

Launched last year and now in use in major grain markets around the world, the ProFoss whole grain system helps to reduce variability and wastage in the milling process. Using near infrared (NIR) technology, it measures moisture and protein in-line in entire batches of whole grain as they arrive at the flour mill. The measurements are made every few seconds and this continuous flow of information helps millers to fine-tune their processes for improved yield and considerable cost savings.

Blending high and low protein wheat: demonstration at Expo Pod, Feb. 25, 10-10:45 a.m.

The 2013 Expo Pods will feature a series of equipment-oriented sessions covering topics related to the use and maintenance of grain testing equipment. The ProFOSS will be shown analyzing a blend of high and low protein wheat.  The blend rates will be adjusted manually to simulate blending to a specification and will display real time fluctuations to the quality of moving grain (protein, moisture & oil when applicable).  

Additional discussions may include:

  • Aligning an auto blending system to catch errors and eliminate risks of the impact of sampling on lot based FGIS analysis
  • Reduce rework and increase confidence by having 100% traceability with a system calibrated against the official Infratec 1241
  • Integrating the system to your process controls in order to automate VFD’s etc.

Presenter: Ron Lindgren, Industry Sales Manager: Milling and Grain, FOSS North America

Moderator: Lance Lamers, Plant Manager, Cargill Grain & Oilseed Supply Chain, North America

FOSS experts will also be available at Stand 718 throughout the show.

How to maintain top performance from a protein analyser Feb. 25 1:45-2:30 p.m

The well-know Infratec 1241 Whole Grain Analyzer will also be on show at the FOSS stand and an expo   pod session will give a hands on demonstration of the recommended routine (daily) maintenance, overview of basic diagnostics, and a tour of worn parts.  Additional discussions may include: 

  • Reviewing recommended seasonal maintenance to maximize the lifetime of the instrument
  • How Near Infrared Transmittance (NIT) works
  • ANN calibrations – the versatility and confidence offered to the industry versus PLS            

Presenter: Jason Stout, UAS Services Corporation Sales Rep. of FOSS Whole Grain Analyzers

Moderator: Paul Steinlage, General Mills

FOSS contacts at GEAPS Expo

Grain-Milling Market Manager, Darren Robey, +45 6021 6903

Senior Manager/Vice President, FOSS North America, Mark Host, +1 952 292 3677

More information about GEAPS expo can be found at

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